EDAX provides EDS, EBSD, WDS and Micro-XRF materials characterization solutions
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EDAX is part of the Ametek Materials Analysis Division
EDAX is the leading provider of EDS, EBSD, WDS and Micro-XRF materials characterization systems
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A Rich History of Innovation and Leadership



EDAX is the global leader in Energy Dispersive X-ray Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), Wavelength Dispersive X-ray Spectrometry (WDS) and X-ray Fluorescence (XRF) systems. EDAX manufactures, markets, and services high-quality products and systems for leading companies in semiconductors, metals, and geological, biological, material and ceramics markets.

Since its founding in 1962, EDAX has utilized its knowledge and expertise to develop ultra-sensitive silicon radiation sensors, digital electronics and specialized application software that facilitate solutions to research, development and industrial requirements.

EDAX is a unit of AMETEK Materials Analysis Division. AMETEK, Inc. is a leading global manufacturer of electronic instruments and electromechanical devices with annual sales of more than $4.0 billion.

Some landmark events that portray EDAX's commitment to maintaining a technology leadership position include:


2016

Introduction of OIM Analysis™ v8.0
Release of the APEX Analysis Software for Tabletop Scanning Electron Microscopes (SEMs)
Introduction of the Octane Elite Plus and Super Silicon Drift Detectors (SDDs)
Launch of the XLNCE SMX-ILH In-Line XRF Analyzer
2015

Release of TEAM™ 4.3 Software
Introduction of the Octane Elite Silicon Drift Detector (SDD) Series
Launch of the XLNCE SMX-BEN XRF Analyzer
2014

Launch of the Element SDD Series
Release of TEAM™ 3D Imaging and Quant (IQ)
Introduction of Pattern Region of Interest Analysis System (PRIAS™), a synergistic new imaging technique to visualize microstructure and provide new views of materials
Introduction of Octane Silicon Drift Detector Series for the Transmission Electron Microscope

2013

Introduction of faster, more productive Hikari XP and DigiView EBSD cameras
Release of TEAM™ Neptune and TEAM™ Trident integrated analysis systems
Introduction of WDS as part of the TEAM™ Analysis System

2012

EDAX celebrates its 50th anniversary
Introduction of the Octane Silicon Drift Detector (SDD) Series
Release of TEAM™ Pegasus integrated EDS and EBSD analysis system
2011

Release of Coating Analysis Software for Orbis Micro-XRF Systems
Introduction of the Apollo XLT SDD Series for the Transmission Electron Microscope (TEM)

2010

Introduction of OIM 6.0 Software

2009

Introduction of the TEAM™ EDS Analysis System
Introduction of the Apollo X and XL Silicon Drift Detector Series

2008

Introduction of the Orbis Micro-XRF Spectrometer
Introduction of the Apex X-ray Microanalysis System
Introduction of the DigiView IV Electron Backscatter Diffraction Detector
Release of EXpert ID Revolutionary Element Identification Software Available within Genesis

2007


Introduction of the Apollo Silicon Drift Detector Series

2006

EDAX and SPECTRO Analytical Instruments become Business Units within the new AMETEK Materials Analysis Division
Introduction of high speed Hikari EBSD Detector
Introduction of OIM 3D Data Collection and Processing Tool 
Introduction of the LambdaSpec (TEXS) Wavelength Dispersive Detector
2005

Introduction of TEXS HP wavelength dispersive X-ray spectrometer
Introduction of the Eagle III XPL automated filter option
Introduction of DigiView III CCD Detector

2004
 
Introduction of Trident three-in-one analysis tool Combines EDS, EBSD and WDS
Introduction of Neptune; complimentary union of EDS and WDS for accurate X-ray microanalysis
Release of Element Detective within Genesis

2003

Introduction of the third generation Eagle µ-Probe micro-focus XRF
Introduction of DigiView II firewire CCD Detector

2002

Introduction of Genesis system, which includes new hardware and multiple detector capabilities combined with Genesis software
Introduction of Pegasus; simultaneous data acquisition optimizing EDS and EBSD
Introduction of three new detectors for microanalysis: the CryoSpec Si(Li) LN2 Free detector, the LambdaSpec (LEXS) Wavelength Dispersive detector and the MegaSpec Silicon Drift Detector
Release of ChI-Scan™ software to incorporate elemental composition into the indexing process in EBSD
EDAX celebrates its 40th anniversary!
EDAX achieves re-certification to the ISO9001:2000 standard
EDAX celebrated its 40th anniversary in 2002  

2001

AMETEK Inc. acquires EDAX Inc.
Introduction of Genesis EDS Software, setting a new standard for overall ease of use, while maintaining flexibility and power
Introduction of DigiView high-speed, high resolution CCD detector, the first fully digital EBSD detector

2000

Release of ViP software, a unique quant routine which take into account and corrects for beam scattering that occurs while working in low vacuum, variable pressure SEM conditions
Introduction of Delphi, an integrated EBSD/EDS phase identification product

1999

EDAX acquires TexSEM Laboratories (TSL), the industry leader in Electron Backscatter Diffraction analysis
Introduction of Automated Crystallography for the TEM (ACT)

1998

Introduction of the Falcon EDS system; providing economy and performance

1997

Introduction of the EAGLE µ-Probe; a new generation of micro-focus XRF
Introduction of the OIM EBSD System on PC platform
First simultaneous OIM/EDS scan


1996

Introduction of the Phoenix - the first Windows-NT based EDS system
Introduction of Sapphire detectors series; providing the best standard resolution of any EDS detector


1995

Introduction of the DX PRIME, a PC Windows-95 based EDS system
Introduction of the CryoSpec liquid nitrogen free detector


1994

TexSEM Laboratories (TSL) founded by the OIM development team offers the first commercially available fully automated EBSD System


1993

Introduction of the DX-95 XRF system
ISO 9001 certification


1992

Introduction of DX-4, the world's first and most popular Windows based EDS system
Introduction of EDAX's unique compact detecting unit (CDU)
Introduction of the first fully automated EBSD system (OIM)


1987

Introduction of the PV9800 EDS X-ray microanalysis system


1985

Introduction of the PV9900 EDS X-ray microanalysis system


1984

First commercially available EBSD System (developed by the forerunner to TSL)


1982

First computer aided Electron Backscatter Diffraction (EBSD) System developed at Bristol University by Dr. David Dingley


1979

Introduction of the PV9500 XRF System


1978

Introduction of the PV9100 EDS X-ray microanalysis system


1972

Nuclear Diodes becomes EDAX International, Inc.
Introduction of the ECON, the first windowless detector


1969

Introduction of Nuclear Diodes 505 - the first commercially available X-ray system for electron microscope applications


1964

Introduction of LN2-cooled detectors


1962

Company founded under the name Nuclear Diodes


 

 

 

 

 

 

 

 

 

 

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