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Join EDAX for Monthly Webinars



EDAX hosts a series of webinars that offer education on microanalysis technologies available to you today. The webinars will run for approximately one hour with time allowed for questions and answers. Please note, time or schedule may be subject to change.

 

2017 Future Topics:

Please click on the title of the webinar to register for the session.

There are currently no webinars scheduled. Please check back soon.

2017 Webinars On Demand:

Please click on the title of the webinar for access to the session.
How to Use NPAR™ in OIM Analysis™ v8 July 2017

With more and more users seeing the power of NPAR™, EBSD Applications Engineer Shawn Wallace, shows you how to use NPAR™ inside OIM Analysis™ v8. He covers all steps involved including how to make and tweak backgrounds, how to change phases, how to recalibrate data sets, and every other step involved in getting the most of your data.

The webinar also covers some of things to watch out for and the effects of NPAR™ on the resulting datasets.

Presented by Shawn Wallace, Applications Engineer, EDAX Inc.

Practical Quantitative Analysis - How to Optimize the Accuracy of your Data June 2017

There are often questions about how to a set up an EDS collection to achieve the “best” data, but the best data is usually dependent both on the analytical goals and the characteristics of the sample. Often, there is no single correct answer. The analyst needs to consider a variety of factors when setting up an analysis to achieve the optimal results. For example, it’s hard to recommend a collection time for a typical EDS analysis because a quick collection time of 5-10 seconds is only realistic on a sample with major and minor elements, but a longer collection time would be more appropriate for samples with trace elements or low count rates. And while a sample with a trace amount of an element may need 100 seconds or longer collection time to achieve minimum detection limits, this does not necessarily improve the quantification accuracy of major elements.

In this webinar, we explore the relationship between collection time, count rate and resolution, and how it affects the data accuracy and error interval. Experimental data also shows the influence of geometry settings, sample surface quality, background adjustments, and peak overlaps and the quantification results.

Presented by Tara Nylese, Global Applications Manager, EDAX Inc. and Dr. Jens Rafaelsen, Applications Engineer, EDAX Inc.

Learn How I Prepare Samples for EBSD Analysis May 2017

Electron Backscatter Diffraction (EBSD) has become an established and accepted microanalysis technique for characterizing crystalline materials. However, like many other techniques, proper sample preparation is necessary to produce quality results.

In this presentation, I present the “standard” preparation technique I use that has been developed over 20 years of analyzing different materials with EBSD. This includes details on how it is done and why we do it. I also discuss exceptions to the standard rules and where and why these come into play.

The goal for this webinar is for participants to gain a practical knowledge of how to better prepare EBSD samples for their analysis.

Presented by Matt Nowell, EBSD Product Manager, EDAX Inc.

EBSD OIM Analysis™ with NPAR™ or How to Salvage Your Datasets! April 2017

The highest quality EBSD analyses prefer the highest quality pattern collection. However, limited acquisition time, non-ideal sample perfection, and restricted SEM setup do not provide optimum collection quality. Many times the resultant OIM maps will have a severely diminished quality and appear to be useless. NPAR™ is a routine that can recover the greatest amount of quality available in the data set.

This webinar will present examples of data sets that were salvaged by the technique.

Presented by Dr. Patrick Camus, Director of Research and Innovation, EDAX Inc.

Advances in EDS Throughput - From X-ray Counts to Solutions March 2017

Ongoing advancements in energy dispersive spectroscopy (EDS) analysis are leading to higher count rates, better light-element sensitivity, and improved energy-resolution stability over a wide range of count rates.

In this webinar we briefly review how the different parts of the EDS system interact, from X-rays leaving the sample to the production of useful data and where recent improvements have taken place. We then apply the gains offered by this new technology to three samples to illustrate the benefits that can be reaped from the changes.

For more information on this topic please see: T Nylese and J Rafaelsen, Microscopy Today 25(2) 2017 46-52

Presented by Tara Nylese, Global Applications Manager, EDAX Inc. and Dr. Jens Rafaelsen, Applications Engineer, EDAX Inc.

Elemental Microstructural Analysis - Combining structure and chemistry
from cm to atoms: EBSD combined with EDS and APT
January 2017

In this joint EDAX-CAMECA webinar the use of chemical information collected together with EBSD microstructural data is reviewed. Combined analysis may be performed from the cm- to nm- scale in the scanning electron microscope. The availability of simultaneously collected EDS data ensures successful EBSD analysis of multiphase materials and identification of particles. For even higher resolution data, EBSD may be paired with atom probe tomography. There it can both be used to pinpoint the exact volume of material to be analysed with atom probe tomography and also to provide the microstructural framework to interpret APT data once it is collected.

Presented by Dr. Rene de Kloe, Applications Specialist, EDAX Inc. and Dr. Katherine Rice, Applications Scientist, CAMECA Instruments

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