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Join EDAX for Monthly Webinars

EDAX hosts a series of webinars that offer education on microanalysis technologies available to you today. The webinars will run for approximately one hour with time allowed for questions and answers. Please note, time or schedule may be subject to change.


2017 Future Topics:

Please click on the title of the webinar to register for the session.

There are currently no webinars scheduled. Please check back soon.

2017 Webinars On Demand:

Please click on the title of the webinar for access to the session.
Advances in EDS Throughput - From X-ray Counts to Solutions March 2017

Ongoing advancements in energy dispersive spectroscopy (EDS) analysis are leading to higher count rates, better light-element sensitivity, and improved energy-resolution stability over a wide range of count rates.

In this webinar we briefly review how the different parts of the EDS system interact, from X-rays leaving the sample to the production of useful data and where recent improvements have taken place. We then apply the gains offered by this new technology to three samples to illustrate the benefits that can be reaped from the changes.

For more information on this topic please see: T Nylese and J Rafaelsen, Microscopy Today 25(2) 2017 46-52

Presented by Tara Nylese, Global Applications Manager, EDAX Inc. and Dr. Jens Rafaelsen, Applications Engineer, EDAX Inc.

Elemental Microstructural Analysis - Combining structure and chemistry from cm to atoms: EBSD combined with EDS and APT January 2017

In this joint EDAX-CAMECA webinar the use of chemical information collected together with EBSD microstructural data is reviewed. Combined analysis may be performed from the cm- to nm- scale in the scanning electron microscope. The availability of simultaneously collected EDS data ensures successful EBSD analysis of multiphase materials and identification of particles. For even higher resolution data, EBSD may be paired with atom probe tomography. There it can both be used to pinpoint the exact volume of material to be analysed with atom probe tomography and also to provide the microstructural framework to interpret APT data once it is collected.

Presented by Dr. Rene de Kloe, Applications Specialist, EDAX Inc. and Dr. Katherine Rice, Applications Scientist, CAMECA Instruments

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