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EDAX is the leading provider of EDS, EBSD, WDS and Micro-XRF materials characterization systems
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EDAX Press Releases



EDAX Octane Elect Silicon Drift Detector
  EDAX Adds Octane Elect EDS System To Portfolio of Industry-Leading EDS Analysis Tools
January  25, 2017
Building on the success of its entry-level Element and game-changing Octane Elite energy dispersive spectroscopy (EDS) systems, EDAX Inc., a leader in electron and X-ray microanalysis instrumentation, announces the addition of a new Octane Elect EDS System to its existing portfolio of EDS analysis tools. more ...

OIM Analysis™ v8
  EDAX Introduces OIM Analysis™ 8.0
July  27, 2016
EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, continues to lead the industry with its recent release of OIM Analysis™ 8.0. more ...

APEX Software for Tabletop SEMs
  EDAX Pairs Element Silicon Drift Detector with New APEX Software Package for Tabletop Scanning Electron Microscopes
July  25, 2016
EDAX, Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has introduced new APEX Analysis software for its Element SDD silicon drift detector for tabletop scanning electron microscopes (SEMs), a product line focused on serving the needs of the industrial market. more ...

EDAX Octane Elite Silicon Drift Detector Series
  EDAX Introduces New Silicon Drift Detectors for Octane Elite Series
July  21, 2016
With the launch of two new detectors for its Octane Elite Silicon Drift Detector (SDD) Series, EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, continues to take detector technology to the next level and offer analytical tools that deliver industry-leading results. more ...

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