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EDAX Insight Newsletter



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Read the EDAX Insight Newsletter to find information on EDAX product introductions, Tips & Tricks, application articles, events and training schedules, employee and customer spotlights and more.

2017
EDAX Insight 2017 Vol. 15 No. 1 (5235 KB) - Articles include: Octane Elect EDS System Joins EDAX Portfolio of EDS Products - Tips & Tricks: Analysis Is Better With APEX™ - EBSD Observations of the Evolution of Crystallographic Orientation during In-Situ Deformation - Otto Schott Institute for Materials Research, Friedrich Schiller University

2016
EDAX Insight 2016 Vol. 14 No. 4 (4730 KB) - Articles include: EDAX Takes the Next Step with OIM Analysis™ v8 Release - Tips & Tricks: Understanding the EDAX Autophase Selection Routine - Calibration Strategies for Coating Measurements on the XLNCE X-ray Metrology Product Line - The School of Earth and Climate Sciences at the University of Maine

EDAX Insight 2016 Vol. 14 No. 3 (5193 KB) - Articles include: A Peek at the APEX Software - Tips & Tricks: Atom Probe Assist™ Mode - When A Smaller EDS Detector Size Is Actually Better - Materials Science & Engineering at Washington State University

EDAX Insight 2016 Vol. 14 No. 2 (6786 KB) - Articles include: Octane Elite - Sharpening Edges in Energy Dispersive Spectroscopy (EDS) Detection - Tips & Tricks: Using Manual Phase Mapping to Find Gold - OIM Analysis™ v8: The Best Just Got Better - Materials Research Institute Aalen

EDAX Insight 2016 Vol. 14 No. 1 (7499 KB) - Articles include: Introducing the XLNCE SMX-ILH XRF Analyzer - Tips & Tricks: EDS Calibration in TEAM™ - Analyzing Absorption of Wood Preservatives Using Micro-XRF - Materials Engineering Department at KU Leuven

2015
EDAX Insight 2015 Vol. 13 No. 4 (8080 KB) - Articles include: NPAR™ - A Novel Approach to Accelerating and Extending EBSD Indexing Performance - Tips & Tricks: Understanding Electron Backscatter Diffraction (EBSD) Background Corrections - Discriminating Glass Fragments Using Micro-XRF Spectrometry with Poly-Capillary Optics - First European X-ray Fluorescence (XRF) Workshop was a Great Success

EDAX Insight 2015 Vol. 13 No. 3 (3403 KB) - Articles include: EDAX Propels Technology With The Latest TEAM™ Release - Tips & Tricks: Analysis Depth for Micro-XRF - Atom Probe Assist for Efficient Atom Probe Tomography Specimen Preparation

EDAX Insight 2015 Vol. 13 No. 2 (4759 KB) - Articles include: Octane Elite SDD Series Lowers the (Analysis)Bar with New Silicon Nitride Windows - Tips & Tricks: Which XRF Line Series to Use? - Fast Simultaneous EDS-EBSD Mapping and ChI-Scan™ Analysis

EDAX Insight 2015 Vol. 13 No. 1 (2532 KB) - Articles include: EDAX Launches the XLNCE X-ray Metrology Series - Tips & Tricks: Spectrum Auto Processing - Analysis of Pb-Free Solder and Solder Films with the XLNCE SMX-BEN XRF Analyzer

2014
EDAX Insight 2014 Vol. 12 No. 4 (4132 KB) - Articles include: Fast Acquisition of Quality EBSD Data on Multiple Sample Types Using the New Hikari Super Detector - Tips & Tricks: Utilizing Internal Intensity Ratios in Micro-XRF - Phase Identification Through Mapping and Spectrum Matching

EDAX Insight 2014 Vol. 12 No. 3 (3511 KB) - Articles include: Investigating Localized Deformation Behavior Through Combined Nanoindentation and Orientation Imaging Microscopy - Tips & Tricks: Advanced OIM - Analyzing Daguerreotyope Chemistry Using the Orbis Micro-XRF Elemental Analyzer

EDAX Insight 2014 Vol. 12 No. 2 (3879 KB) - Articles include: 3D Visualization of EDS Map Analyses From FIB Slices - Octane Silicon Drift Detector (SDD) Series for the Transmission Electron Microscope (TEM) - EDAX Opens Demo Facility in India

EDAX Insight 2014 Vol. 12 No. 1 (4126 KB) - Articles include: EDAX Brings Octane Silicon Drift Detector (SDD) Technology to the Transmission Electron Microscope - Tips & Tricks: Orbis Vision Version 2.1 Update - Revised KENO Function - EDAX Introduces New Pattern Region of Interest Analysis System (PRIAS™)

2013
EDAX Insight 2013 Vol. 11 No. 4 (2769 KB) - Articles include: Transmission-EBSD: Improving the Spatial Resolution of EBSD - Tips & Tricks: Transmission-EBSD - Elemental Analysis Through a Plastic Barrier

EDAX Insight 2013 Vol. 11 No. 3 (2963 KB) - Articles include: EDAX Increases the Speed of the Hikari XP More Than 50% - Merging Orbis Elemental Map Images - Benefits of WDS Spectral Resolution for Elemental Confirmation

EDAX Insight 2013 Vol. 11 No. 2 (3850 KB) - Articles include: WDS Joins the Team! - TEAM™ WDS Element Scan Simplifies Peak Separation and Trace Element Detection Analyses - TEAM™ Trident Helps Engineer Better Wear Materials

EDAX Insight 2013 Vol. 11 No. 1 (3271 KB) - Articles include: TEAM™ Pegasus with Octane SDDs Accelerates Development of Lightweight Automotive Materials - Optimizing Spatial Resolution for EDS Analysis - Smart Phase Mapping Provides the Next Level of Materials Insight

2012
EDAX Insight 2012 Vol.10 No.4 (3642 KB) - Articles include: Octane Silicon Drift Detectors - Maximize Your Materials Insight - Dead-Time Optimization for High Productivity Data Analysis - Defining Silicon Drift Detector Performance

EDAX Insight 2012 Vol.10 No.3 (1330 KB) - Articles include: Welcome to the first issue of EDAX Insight - Introducing the Octane Silicon Drift Detector (SDD) Series - The Importance of the Orientation Precision Performance of Electron Backscatter Diffraction - Improved Trace Element Sensitivity with the New Apollo XRF ML-50 Silicon Drift Detector on the Orbis Micro-XRF Elemental Analyzer

EDAX FOCUS 2012 Vol.10 No.2 (659 KB) - Articles include: EDAX Launches the New Hikari XP EBSD Camera - High Speed EBSD - Characterization of Metal Thin Films for Microelectronics Interconnects using the Hikari XP

EDAX FOCUS 2012 Vol.10 No.1 (540 KB) - Articles include: EDAX Launches the New TEAM™ Pegasus Analysis System, EBSD Sample Preparation - the Basics, Using TEAM™ Pegasus to Characterize Intermetallic Phases in Duplex Steel Alloys, Also Available from AMETEK - Taylor Hobson

2011
EDAX FOCUS 2011 Vol.9 No.3 (710 KB) - Articles include: Orbis Vision Software Version 1.6 Release, Optimizing Structure Files in OIM Data Collection, Pharmaceutical Impurity and Compound Analysis with EDS

EDAX FOCUS 2011 Vol.9 No.2 (626 KB) - Articles include: TEAM™ EDS Analysis System, Spectral Overlay in TEAM™ EDS, Characterization of Thermoelectric Material with EBSD and EDS

EDAX FOCUS 2011 Vol.9 No.1 (452 KB) - Articles include: TEAM™ EDS System for the TEM, TEAM™ A New Generation for EDS Mapping, Particle Applications in the Hard Disk Industry

2010
EDAX FOCUS 2010 Vol. 8 No. 3 (873 KB) - Articles include: Optimizing EDS for TEM, Multifield Mapping, EBSD Characterization of Stress Corrosion Cracks in 2124 Alloys

EDAX FOCUS 2010 Vol. 8 No. 2 (717 KB) - Articles include: EDAX Introduces OIM 6.0 Software, Scanning Spatial Resolution Limits, Optimization of Collection Parameters for Site Specific Feature Microanalysis

EDAX FOCUS 2010 Vol. 8 No. 1 (627 KB) - Articles include: TEAM™ Smart Feature, Primary X-ray Beam Filters for Micro-XRF, Image Processing (Enhanced) for EBSD Analysis

2009
EDAX FOCUS 2009 Vol. 7 No. 4 (684 KB) - Articles include: EDAX Introduces TEAM™ EDS, Characterizing Fracture Surfaces with Dual EDS Detectors, Case Study: Phase Identification Using a Trident

EDAX FOCUS 2009 Vol. 7 No. 3 (481 KB) - Articles include: Microstructural Characterization of Thin Film Photovoltaics Using Electron Backscatter Diffraction, Quantification in Wavelength Dispersive Spectrometry, TSL 10th Year Anniversary

EDAX FOCUS 2009 Vol. 7 No. 2 (633 KB) - Articles include: Electron Backscatter Diffraction (EBSD) Based Analysis of Lead-Free Solders, Generating Micro-XRF Overlay Maps, Welcome to EDAX, Join EDAX for Monthly Web Seminars

EDAX FOCUS 2009 Vol. 7 No. 1 (584 KB) - Articles include: The Apollo Silicon Drift Detector (SDD) Series, Orientation Imaging Microscopy; Comboscan Explained, The New Orbis Micro-XRF Analyzer Series

2008
EDAX FOCUS 2008 Vol. 6 No. 4 (1.19 KB) - Articles include: Pileup Effects in Energy Dispersive Spectroscopy, Using Templates in OIM Analysis™

EDAX FOCUS 2008 Vol. 6 No.3 (1.28 KB) - Articles Include: EDAX Introduces the New Orbis Micro-XRF Spectrometer, System Automation - Making the Genesis System Work for You, Resolving EDS Overlaps Using WDS

EDAX FOCUS 2008 Vol. 6 No. 2 (1.38 KB) - Articles include: EDAX Introduces the Genesis Apex System, EDAX Introduces the DigiView IV EBSD Detector, Standardless Quantification, Al 7075 Carabiner Analysis

EDAX FOCUS 2008 Vol. 6 No. 1 (1.31 KB) - Articles include: The Right Silicon Drift Detector for the Right Application, Creating User Palettes for Eagle XRF Maps, Characterizing Plastic Deformation with OIM

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