Orientation Imaging Microscopy (OIM) Analysis™
The Most Powerful, Flexible, and Easy to Use Tool for the Visualization and Analysis of Electron Backscatter Diffraction (EBSD) Mapping Data
OIM Analysis™ is a technique based on the automated collection and analysis of EBSD patterns. This mapping data provides information on the orientation, phase distribution, grain size and shape, grain boundary structure, and local deformation of crystallographic microstructures. OIM Analysis™ provides virtually unlimited potential for interrogating the wealth of information contained in OIM scans.
What's New in OIM Analysis™ v8?
With the addition of new functionality and features, OIM Analysis™ v8 has reset the standard for EBSD data analysis capability and enables users to achieve new insight into microstructural characterization. Click here to find out more about OIM Analysis™ v8.
OIM Analysis™ Standard Features
OIM Maps provide colorful and meaningful graphics, which give a useful insight into material microstructures.
OIM Charts show numerical representations of the measured microstructure with statistical information for easy comparisons.
OIM Plots offer visualization of measured orientation and misorientation distributions.
The QuickGen Toobar is an intuitive starting point for analysis, offering quick access to commonly used maps, charts, and plots.
OIM Analysis™ QuickGen Toolbar
OIM Templates offer an easy-to-use tool for performing repetitive, customized analysis of OIM data.
Data Partitioning enables the splitting of OIM data into different microstructural subsets so that the different portions can be measured separately.
OIM Data Partitioning
Data Highlighting enables the analyst to identify specific data ranges and microstructural features on maps and plots.
Interactive Analysis allows the analyst to conduct a manual interrogation of data so that the information of interest can be extracted.
OIM Batch Processor
OIM Batch Processor enables the preparation and analysis of multiple datasets easily and consistently in a single action.
OIM Project Tree
OIM Project Tree
OIM Project Tree is an intuitive data management structure for novice and advanced users.
OIM Analysis™ EBSD Indexing
Even the best analysis tools may generate initial low-quality data. However, OIM Analysis™ has the resources to evaluate data quality and to improve it using EBSD pattern reindexing.
Comprehensive Analysis offers grouped functions for a wide range of focused analysis within an integrated analysis package.
- Advanced Grain Analysis
- Advanced Texture Analysis
- Advanced Boundary Analysis
- Advanced Materials Properties Analysis
- Advanced Data Manipulation
OIM 3D Visualization
OIM Analysis™ extends comprehensive EBSD characterization into 3D EBSD.