|
|
| |
|
|
|
The Hikari continues EDAX-TSL's tradition of pioneering EBSD technology. Hikari is a full featured, completely integrated CCD-based detector that excels at all EBSD applications, whether they require speed and sensitivity or signal to noise performance. Hikari can achieve simultaneous acquisition and indexing speeds up to 450 patterns per second for many materials. |
|
Features:
- Speed: 450 indexed patterns per second
- Camera console integrated within OIMTM software
- Customizable image processing functionality
- Triplet Indexing for high speed accuracy
- Multi-threaded programming to harness the power of multi-processor PC's
- User configurable camera positioning
- High precision camera slide
- Sleeker camera design, advanced CCD camera chip and improved pattern imaging optics
|
 |
|
111 Crystal Direction Map.
|
Performance:
The Hikari detector performs EBSD scans at 450 indexed points per second (pps) while accomplishing indexing success rates of greater than 99%. The combination of high-speed pattern acquisition with reliable and accurate pattern analysis provided by the Hikari allows users to obtain consistent high-quality data in shorter times. This high level of performance is unequalled by any other EDSD product. EBSD: Speed with Accuracy
|
|
Benefits:
-
Significantly reduces OIMTM scan times
-
Reduces the need for overnight scans
-
Blend of speed and quality well suited for both production and research lab environments
-
Rapid collection rates reduce susceptibility to long term SEM beam instability
-
Ideal for combined ion/electron beam applications of 3D OIMTM EBSD
|
IPF + IQ Map.
|
|
|
Hikari pattern image processing functionality within OIMTM DC.
|
|
Control:
The new and improved camera control console is now embedded within the Orientation Imaging Microscopy (OIMTM ) data collection software. The acquisition and optimization controls are organized in an easy-to-follow layout. Image processing functionality is available for optimization of pattern display, depending on the preferences of the user. The user may save preferred processing routines are recipes for convenient recall at a later date.
|
| Forward Scatter Detector:
The Hikari comes standard with an integrated forward scatter detector (FSD) for characterizing material and mineral microstructures in the SEM. The FSD is an ideal analytical tool for visualizing the microstructure to select a region for OIMTM data collection and for qualitatively inspecting the microstructure to characterize deformation and strain gradients critical to materials design.
-
Adjustable detector insertion provides multiple imaging
-
Contrasts
-
Unique imaging capability for your EDAX EBSD system
-
Orientation contrast
-
Topographical contrast
-
Compositional contrast
-
Quality display of deformation and strain gradients
-
Enhanced imaging functionality within OIMTM software
|
FSD image illustrating orientation and compositional contrast of quartzenstatite sample courtesy of Dr. Karsten Kunze, Geologisches Institut, Zurich, Switzerland.
|
|
| |
|
|
|
