OIM^TM Data Collection is a uniquely powerful, integrated suite of tools for acquiring and analyzing electron backscatter diffraction (EBSD) patterns in the scanning electron microscope (SEM). Crystallographic orientation data can be collected in both interactive and automatic modes, easily satisfying the demands of any modern materials science, characterization, or geological laboratory.

• OIM^TM 6.0 New Software Release
• Fast Data Collection without sacrificing accuracy
• Accurate Indexing of All Seven Crystal Systems
• EBSD Sample Preparation 
• Complete integration with Hikari and Digiview IV Detectors
• Phase ID and phase mapping

The most comprehensive solution available for analyzing orientation and related aspects of crystalline microstructures using EBSD. Virtually unlimited potential for interrogating the wealth of information contained in OIM^TM scans, and all in one program. OIM^TM provides ease of use for novice users and very extensive data analysis and mining capabilities for advanced users.

• QuickGen Tool, Push-button solutions, and customizable templates
• Virtually limitless selection of maps, charts, and plots
• Interactive data analysis using Highlighting functionality
• OIM^TM   3D: EBSD Data Analysis, and Visualization
• Effective Grain Boundary and Misorientation Analysis
• The market-preferred tool for EBSD data analysis

• Hikari High Speed EBSD detector
• DigiView IV Detector
• Integrated Forward Scatter Detector
• EBSD: Speed with Accuracy

• 3D EBSD Wizard
• 3D EBSD Visualization Software

• Introduction to Delphi
• Phase identification of all 7 crystal systems
• Integrated SEM imaging, EBSD data collection, and EDAX EDS simultaneous data collection 
• Easy to use Software Interface
• User-selectable database searching (ICDD, NIST, ICSD, AMCS, TSL)  
• Integration with Hikari and DigiView 3 detectors
• Automated report generation