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EBSD: Speed with Accuracy

Orientation Imaging Microscopy (OIM^TM) mapping via automated analysis of Electron Backscatter Diffraction (EBSD) patterns has fast become an established microstructural analysis tool in the electron microscopy community. The rapid data acquisition rates (see chart below) have made it a very efficient analytical method useful in research and production environments. Currently orientation mapping speeds of over 450 analyzed patterns per second have been achieved. With these acquisition rates speeds now available, applications of EBSD and OIM^TM mapping have grown at an outstanding rate. Scans that used to take hours or overnight can now be completed in minutes.

The most efficient method of EBSD data collection is to simultaneously collect and index diffraction patterns. Only then do you have immediate confidence in the EBSD results.

As shown below, the Hikari EBSD detector simultaneously collects and indexes diffraction patterns at very high speeds. Hikari is the perfect choice for all materials, minerals, crystal structures, and phase combinations.

The selected samples cover a large range of material types, multiple crystal structures, multi-phase, and deformed materials. How fast can Hikari scan your sample?

Forward Scatter Detector and Orientation Map	Image Quality and Orientation Map	Material: Stainless Steel Grade 316L Structure: Face Centered Cubic Speed: 200 indexed points per second Index Success Rate: 99.5%
Forward Scatter Detector and Orientation Map	Image Quality and Phase Map	Material: Duplex Steel 2204 Structure: Cubic (Austenite/Ferrite) Speed: 200 indexed points per second Index Success Rate: 97.8%
Forward Scatter Detector and Orientation Map	Image Quality and Phase Map	Material: Single phase Titanium alloy Structure: Cubic (Austenite/Ferrite) Speed: 195 indexed points per second Index Success Rate: 95.9%
Forward Scatter Detector and Orientation Map	Image Quality and Phase Map	Material: Dual phase Titanium Boride and Titanium Nitride Structure: Hexagonal and Cubic Speed: 193 indexed points per second Index Success Rate: 94.8%
Forward Scatter Detector and Orientation Map	Image Quality and Phase Map	Material: Dual phase Copper and Nickel Structure: Cubic (Austenite/Ferrite) Speed: 100 indexed points per second Index Success Rate: 97.1% Note that 100 indexed patterns were still achieved even with the simultaneous collection of EDS data for separation of Cu and Ni.
Forward Scatter Detector and Orientation Map	Image Quality and Phase Map	Material: Deformed Copper Structure: Cubic (Austenite/Ferrite) Speed: 200 indexed points per second Index Success Rate: 99%