edax - Overview

about EDAX

news & events

services & support

literature

our products

Print View

Delphi Features

Delphi is a powerful tool for phase identification of EBSD diffraction patterns. Delphi can solve diffraction patterns using available third party databases, a TSL-certified database, or a user-defined database. Or, if you have identified a phase not already cataloged, then you can create your own diffraction structure file to be used in future searches. Any way you use it, Delphi is an invaluable tool for all ananalysts indicated in positive identification of phases using EBSD.

Phase Identification of all seven crystal systems
High contrast EBSD patterns obtained from a selection of cameras
Simultaneous display of electron and EBSD images
Electron beam positioning via mouse click on electron image
Optional integration with EDAX EDS systems
Support for data from all EDS systems using manual element input

Dephi User Interface: Key Features and Functionality all Accessible from One Interface

Additional Features:

Flexible boolean-logic editor provides a powerful means of searching the phase database
Built-in structure file generator from atomic positions for advanced users
Conversion of X-ray database parameters for use in electron diffraction
No calibration needed following installation
Results at each point automatically saved
Area of investigation automatically marked on electron image and historical record kept of location
Project utilities for QA lab management
Automated report generation
Crystallographic orientation obtained simultaneously
Bandwidth display and measurement for differentiating using lattice spacings

Database Functionality:

Interface to third party crystallographic databases (ICDD, ICSD, NIST, etc.)
Candidate phases produced from automated search of multiple phase databases
Proprietary DELPHI database of phase parameters certified by TSL for electron backscatter diffraction
Use of chemical composition as a filter to improve selection of candidate phases