EDAX AT A GLANCE

EDAX is now combined with Gatan to develop new approaches to uncover insights and explore the boundaries of your transmission and scanning electron microscopy (TEM and SEM) research. Under the Gatan name, customers will receive reliable, cutting-edge products of the highest quality while maintaining the responsive customer care that you expect.

Now together, let’s discover how to achieve your next breakthrough.

RECENT NEWS

Workshop: Unlocking materials insights: DualBeam microscopy and analytical techniques in focus

Register for the "Unlocking materials insights: DualBeam microscopy and analytical techniques in focus" workshop – July 8

This workshop hosted by Thermo Fisher Scientific at the the NanoPort in Eindhoven, The Netherlands aims to bridge the gap between industry and academia providing a unique platform for discussing advanced technologies like 3D analytics and transmission Kikuchi diffraction (TKD), along with the analysis of deformed materials through spherical indexing in the EDAX OIM Analysis™ software. Participants will also learn about the automation of materials analysis and reporting, enabling more efficient workflows and enhanced data accuracy.

Download your free copy of the March issue of the Gatan Insight newsletter

Articles include: Understanding precipitate behavior in aluminum alloys: EBSD insights for aerospace and defense performance – Custom Scanning – Smarter control for modern spectrum imaging – Revealing lithium alloy phases in indium solid state battery anodes

Did you miss the “Advancing EBSD for beam-sensitive materials: From noise to insights” webinar? Watch it on demand

In this webinar, we present strategies for overcoming these limitations using the EDAX® Clarity™ system, enabling low-dose EBSD on perovskites and other beam-sensitive materials, and demonstrate the insights obtained by combining this high-sensitivity system with spherical indexing in EDAX OIM Analysis™.

Check out our new “Alternative master patterns for spherical indexing: Improving time to results for OIM Matrix” application note

Discover how spherical indexing paired with innovative alternative master pattern generation can dramatically accelerate EBSD analysis, even for challenging or low‑quality patterns. This application note reveals faster, easier ways to achieve high‑accuracy orientation results—unlocking the full power of OIM Matrix for real‑world materials characterization.